Characterization of semiconductor materials. (Record no. 280930)

000 -LEADER
fixed length control field 00376nam a22001457a 4500
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20151105150605.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 151105b xxu||||| |||| 00| 0 eng d
040 ## - CATALOGING SOURCE
Transcribing agency UG
050 ## - LIBRARY OF CONGRESS CALL NUMBER
Classification number QC 612
Item number S4 K26
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Kane, Phillip Francis
Dates associated with a name 1920
245 ## - TITLE STATEMENT
Title Characterization of semiconductor materials.
300 ## - PHYSICAL DESCRIPTION
Extent xvi, 352 p.
Other physical details illus
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Entry Department sys
Source of classification or shelving scheme
Holdings
Price effective from Permanent Location Date last seen Not for loan Date acquired Source of classification or shelving scheme Koha item type Shelving location Barcode Damaged status Lost status Withdrawn status Current Location Full call number
2015-11-05Turkeyen Campus2015-11-05 2015-11-05 3 Weeks LoanScience & Technology43563  WithdrawnTurkeyen CampusQC 612 S4 K26