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Electronic testing, compiled and

by Farkas, Lucien Leslie

Published by : McGraw-Hill. (New York, ) Physical details: 304p. Year: 1966

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Item type	Location	Call number	Status	Date due
3 Weeks Loan	Turkeyen Campus Science & Technology	Tk7870 Far. (Browse shelf)	Available

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Previous	TK7868 S9 S6 Transistor switching and sequential circuits .	TK7868.158 S76 Microcomputer interfacing /	TK 7868 .158 S76 Microcomputer interfacing /	Tk7870 Far. Electronic testing, compiled and	TK7870 B47 Principles of electronic instrumentation and measurement/	TK7870 C445 Analysis and design of electronic circuits	Next

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